Roughening, Deroughening, and Nonuniversal Scaling of the Interface Width in Electrophoretic Deposition of Polymer Chains

Authors

Frank W. Bentrem, University of Southern Mississippi
Ras B. Pandey, University of Southern MississippiFollow
Fereydoon Family, Emory University

Document Type

Article

Publication Date

7-1-2000

Department

Computing

School

Computing Sciences and Computer Engineering

Abstract

Growth and roughness of the interface of deposited polymer chains driven by a field onto an impenetrable adsorbing surface are studied by computer simulations in (2 + 1) dimensions. The evolution of the interface width W shows a crossover from short-time growth described by the exponent beta(1) to a long-time growth with exponent beta(2) (>beta(1)) Tne saturated width increases, i.e., the interface roughens, with the molecular weight L-c, but the roughness exponent alpha (from W-s similar to L-alpha) becomes negative in contrast to models for particle deposition; cr depends on the chain length-a nonuniversal scaling with the substrate length L. Roughening and deroughening occur as the field E and the temperature T compete such that W-s approximate to (A+BT)E-1/2.

Comments

©Physical Review E

http://journals.aps.org/pre/pdf/10.1103/PhysRevE.62.914

Publication Title

Physical Review E

Volume

62

Issue

1

First Page

914

Last Page

917

Recommended Citation

Bentrem, F. W., Pandey, R. B., Family, F. (2000). Roughening, Deroughening, and Nonuniversal Scaling of the Interface Width in Electrophoretic Deposition of Polymer Chains. Physical Review E, 62(1), 914-917.
Available at: https://aquila.usm.edu/fac_pubs/4172