Roughening, Deroughening, and Nonuniversal Scaling of the Interface Width in Electrophoretic Deposition of Polymer Chains
Computing Sciences and Computer Engineering
Growth and roughness of the interface of deposited polymer chains driven by a field onto an impenetrable adsorbing surface are studied by computer simulations in (2 + 1) dimensions. The evolution of the interface width W shows a crossover from short-time growth described by the exponent beta(1) to a long-time growth with exponent beta(2) (>beta(1)) Tne saturated width increases, i.e., the interface roughens, with the molecular weight L-c, but the roughness exponent alpha (from W-s similar to L-alpha) becomes negative in contrast to models for particle deposition; cr depends on the chain length-a nonuniversal scaling with the substrate length L. Roughening and deroughening occur as the field E and the temperature T compete such that W-s approximate to (A+BT)E-1/2.
Physical Review E
Bentrem, F. W.,
Pandey, R. B.,
(2000). Roughening, Deroughening, and Nonuniversal Scaling of the Interface Width in Electrophoretic Deposition of Polymer Chains. Physical Review E, 62(1), 914-917.
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