Dieelectic Relaxation Studies of Acid Containing Short Side-Chain Perfluorosulfonate Ionomer Membranes
Document Type
Article
Publication Date
4-27-1992
Department
Polymers and High Performance Materials
Abstract
The storage and loss components of the complex dielectric permittivities of aqueous H2SO4-containing short-side-chain perfluorosulfonic acid membranes were determined as a function of acid concentration and temperature. An equivalent circuit model and its mathematical representation is proposed for these ionomers. This simple, but successful, permittivity model reinforces our usual partitioning of the dielectric relaxation spectra into contributions that represent the short-range (intracluster) and long-range (intercluster) motions of ions throughout the known microphase-separated morphology. A low-frequency graphical feature on the experimental spectra that is reflective of and quantifies the tortuosity of long-range ion conductive pathways was identified and determined as a function of acid concentration and temperature. A high-frequency relaxation peak attributed to a fluctuating polarization that occurs at the cluster/TFE interfaces yields the time scales for intracluster ion motions and suggests the existence of two types of clusters for the case of low acid concentration.
Publication Title
Macromolecules
Volume
25
Issue
9
First Page
2369
Last Page
2380
Recommended Citation
Deng, Z.,
Mauritz, K. A.
(1992). Dieelectic Relaxation Studies of Acid Containing Short Side-Chain Perfluorosulfonate Ionomer Membranes. Macromolecules, 25(9), 2369-2380.
Available at: https://aquila.usm.edu/fac_pubs/6778